文献
J-GLOBAL ID:201902225226189993
整理番号:19A0128621
磁気力顕微鏡を用いた非磁性金属薄膜の検出【JST・京大機械翻訳】
Detection of nonmagnetic metal thin film using magnetic force microscopy
著者 (5件):
Wakaya Fujio
(Center for Science and Technology Under Extreme Conditions, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan)
,
Oosawa Kenta
(Center for Science and Technology Under Extreme Conditions, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan)
,
Kajiwara Masahiro
(Center for Science and Technology Under Extreme Conditions, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan)
,
Abo Satoshi
(Center for Science and Technology Under Extreme Conditions, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan)
,
Takai Mikio
(Center for Science and Technology Under Extreme Conditions, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
113
号:
26
ページ:
261601-261601-4
発行年:
2018年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)