文献
J-GLOBAL ID:201902230820268507
整理番号:19A0182590
走査型Electron顕微鏡における二次Electronハイパースペクトルイメージングを用いた複雑ハイブリッドペロブスカイト光起電力膜の断面における臭化物偏析のナノスケールマッピング【JST・京大機械翻訳】
Nanoscale Mapping of Bromide Segregation on the Cross Sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in a Scanning Electron Microscope
著者 (9件):
Kumar Vikas
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
,
Schmidt Whitney L.
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
,
Schileo Giorgio
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
,
Masters Robert C.
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
,
Wong-Stringer Michael
(Department of Physics and Astronomy, University of Sheffield, U.K.)
,
Sinclair Derek C.
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
,
Reaney Ian M.
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
,
Lidzey David
(Department of Physics and Astronomy, University of Sheffield, U.K.)
,
Rodenburg Cornelia
(Department of Materials Science and Engineering, University of Sheffield, U.K.)
資料名:
ACS Omega
(ACS Omega)
巻:
2
号:
5
ページ:
2126-2133
発行年:
2017年
JST資料番号:
W5044A
ISSN:
2470-1343
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)