文献
J-GLOBAL ID:201902233881754230
整理番号:19A0659742
原子間力顕微鏡を用いた個々のサブミクロン粒子の直接表面張力測定【JST・京大機械翻訳】
Direct Surface Tension Measurements of Individual Sub-Micrometer Particles Using Atomic Force Microscopy
著者 (8件):
Lee Hansol D.
(Department of Chemistry, University of Iowa, Iowa, United States)
,
Estillore Armando D.
(Department of Chemistry and Biochemistry, University of California, San Diego)
,
Morris Holly S.
(Department of Chemistry, University of Iowa, Iowa, United States)
,
Ray Kamal K.
(Department of Chemistry, University of Iowa, Iowa, United States)
,
Alejandro Aldair
(Department of Chemistry, University of Iowa, Iowa, United States)
,
Grassian Vicki H.
(Department of Chemistry and Biochemistry, University of California, San Diego)
,
Grassian Vicki H.
(Department of Nanoengineering and Scripps Institute of Oceanography, University of California, San Diego)
,
Tivanski Alexei V.
(Department of Chemistry, University of Iowa, Iowa, United States)
資料名:
Journal of Physical Chemistry A
(Journal of Physical Chemistry A)
巻:
121
号:
43
ページ:
8296-8305
発行年:
2017年
JST資料番号:
C0334B
ISSN:
1089-5639
CODEN:
JPCAFH
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)