文献
J-GLOBAL ID:201902234540644109
整理番号:19A1414682
高破壊電圧のヘテロ接合p-Cu_2O/n-Ga_2O_3ダイオード【JST・京大機械翻訳】
Heterojunction p-Cu2O/n-Ga2O3 diode with high breakdown voltage
著者 (6件):
Watahiki Tatsuro
(Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, 661-8661 Hyogo, Japan)
,
Yuda Yohei
(Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, 661-8661 Hyogo, Japan)
,
Furukawa Akihiko
(Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, 661-8661 Hyogo, Japan)
,
Yamamuka Mikio
(Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, 661-8661 Hyogo, Japan)
,
Takiguchi Yuki
(Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro, Tokyo 152-8550, Japan)
,
Miyajima Shinsuke
(School of Engineering, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro, Tokyo 152-8550, Japan)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
111
号:
22
ページ:
222104-222104-3
発行年:
2017年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)