文献
J-GLOBAL ID:201902247248009747
整理番号:19A0624014
二重ノルム低ランク分解に基づく新しいパターン化織物欠陥検出アルゴリズム【JST・京大機械翻訳】
A Novel Patterned Fabric Defect Detection Algorithm based on Dual Norm Low Rank Decomposition
著者 (5件):
Wang Junpu
(School of Electronic and Information Engineering, Zhongyuan University of Technology, ZhengZhou, China)
,
Li Chunlei
(School of Electronic and Information Engineering, Zhongyuan University of Technology, ZhengZhou, China)
,
Liu Zhoufeng
(School of Electronic and Information Engineering, Zhongyuan University of Technology, ZhengZhou, China)
,
Yu Miao
(School of Electronic and Information Engineering, Zhongyuan University of Technology, ZhengZhou, China)
,
Dong Yan
(School of Electronic and Information Engineering, Zhongyuan University of Technology, ZhengZhou, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
ICSP
ページ:
323-327
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)