文献
J-GLOBAL ID:201902254277685721
整理番号:19A1483752
二重CoFeB/MgO界面磁気トンネル接合に対する磁気的および電気的性質の挿入層厚み依存性【JST・京大機械翻訳】
Insertion Layer Thickness Dependence of Magnetic and Electrical Properties for Double-CoFeB/MgO-Interface Magnetic Tunnel Junctions
著者 (8件):
Miura S.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
,
Nguyen T. V. A.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
,
Endoh Y.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
,
Sato H.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
,
Ikeda S.
(Center for Spintronics Integrated Systems, Tohoku University, Sendai, Japan)
,
Nishioka K.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
,
Honjo H.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
,
Endoh T.
(Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan)
資料名:
IEEE Transactions on Magnetics
(IEEE Transactions on Magnetics)
巻:
55
号:
7
ページ:
ROMBUNNO.3401004.1-4
発行年:
2019年
JST資料番号:
A0339B
ISSN:
0018-9464
CODEN:
IEMGAQ
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)