文献
J-GLOBAL ID:201902256226569638
整理番号:19A1998042
非接触プラズマへの移行における2電子温度成分のThomson散乱測定
Thomson Scattering Measurement of Two Electron Temperature Components in Transition to Detached Plasmas
著者 (5件):
OHSHIMA Hiroshi
(Graduate School of Engineering, Nagoya University)
,
KAJITA Shin
(Institute of Materials and Systems for Sustainability, Nagoya University)
,
TANAKA Hirohiko
(Graduate School of Engineering, Nagoya University)
,
OHNO Noriyasu
(Graduate School of Engineering, Nagoya University)
,
VAN DER MEIDEN Hennie J.
(DIFFER, Dutch Institute for Fundamental Energy Research)
資料名:
Plasma and Fusion Research (Web)
(Plasma and Fusion Research (Web))
巻:
13
ページ:
1201099(J-STAGE)
発行年:
2018年
JST資料番号:
U0045A
ISSN:
1880-6821
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
日本 (JPN)
言語:
英語 (EN)