文献
J-GLOBAL ID:201902263284927080
整理番号:19A1414845
電気光学二重コム干渉法による1.2kmまでの長距離測定【JST・京大機械翻訳】
Long distance measurement up to 1.2 km by electro-optic dual-comb interferometry
著者 (8件):
Wu Hanzhong
(Innovation Research Institute, Tianjin University, 300072, Tianjin, China)
,
Zhao Tuo
(School of Marine Science and Technology, Tianjin University, 300072 Tianjin, China)
,
Wang Zhiyang
(School of Marine Science and Technology, Tianjin University, 300072 Tianjin, China)
,
Zhang Kai
(School of Marine Science and Technology, Tianjin University, 300072 Tianjin, China)
,
Xue Bin
(School of Marine Science and Technology, Tianjin University, 300072 Tianjin, China)
,
Li Jianshuang
(National Institute of Metrology, Beijing 100013, China)
,
He Mingzhao
(National Institute of Metrology, Beijing 100013, China)
,
Qu Xinghua
(State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, 300072 Tianjin, China)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
111
号:
25
ページ:
251901-251901-5
発行年:
2017年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)