文献
J-GLOBAL ID:201902265737849813
整理番号:19A2448871
P-1.12:埋込み輝度センサの信頼性改善【JST・京大機械翻訳】
P-1.12: Reliability Improvement on Embedded Luminance Sensor
著者 (7件):
Liu Shih-Bin
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
,
Fan WeiFeng
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
,
Lin Pei-Yang
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
,
Yu Chia-Min
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
,
Qiao Yanbing
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
,
Lai Hsin-Chieh
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
,
Chung Te-Chen
(Product Development Center, InfoVision Optoelectronics Co., Ltd., Kunshan, Jiangsu, China)
資料名:
Digest of Technical Papers. SID International Symposium (Society for Information Display)
(Digest of Technical Papers. SID International Symposium (Society for Information Display))
巻:
50 Suppl S1
ページ:
669-672
発行年:
2019年
JST資料番号:
E0907A
ISSN:
0097-966X
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)