文献
J-GLOBAL ID:201902280904218349
整理番号:19A1113394
全電離線量と変位放射線損傷により誘導されたPPD CISsにおける画像遅延劣化の解析【JST・京大機械翻訳】
Analysis of Image Lag Degradation in PPD CISs Induced by Total Ionizing Dose and Displacement Radiation Damage
著者 (8件):
Wang Zujun
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
,
Xue Yuanyuan
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
,
Liu Jing
(School of materials science and engineering, Xiangtan University, Hunan, 411105, China)
,
Chen Wei
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
,
Ma Wuying
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
,
He Baoping
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
,
Yao Zhibin
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
,
Sheng Jiangkun
(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, 710024, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
RADECS
ページ:
1-5
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)