文献
J-GLOBAL ID:201902283319163861
整理番号:19A2448899
P-6.9:G8.6 LCD上の光劣化を抑制する高信頼性a-Si:H TFT【JST・京大機械翻訳】
P-6.9: High-reliability a-Si:H TFT with Repressing Photo-degradation on G8.6 LCDs
著者 (10件):
Chao Wei
(Chuzhou HKC Optoelectronics Technology Co. Ltd., China)
,
An-Thung Cho
(Chuzhou HKC Optoelectronics Technology Co. Ltd., China)
,
An-Thung Cho
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
,
Hejing Zhang
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
,
Qionghua Mo
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
,
Zhen Liu
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
,
Fengyun Yang
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
,
Kaijun Liu
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
,
James Hsu
(Chuzhou HKC Optoelectronics Technology Co. Ltd., China)
,
James Hsu
(Chongqing HKC Optoelectronics Technology Co. Ltd., China)
資料名:
Digest of Technical Papers. SID International Symposium (Society for Information Display)
(Digest of Technical Papers. SID International Symposium (Society for Information Display))
巻:
50 Suppl S1
ページ:
779-780
発行年:
2019年
JST資料番号:
E0907A
ISSN:
0097-966X
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)