文献
J-GLOBAL ID:202002210340986132
整理番号:20A2019841
負および正バイアス応力下のnチャネルLTPS-TFTにおける二段階劣化【JST・京大機械翻訳】
Two-stage degradation in n-channel LTPS-TFTs under negative and positive bias stresses
著者 (6件):
Guo Jian
(School of Optics and Photonics, Beijing Engineering Research Center of Mixed Reality and Advanced Display, Beijing Institute of Technology, Beijing, China)
,
Yu Zhinong
(School of Optics and Photonics, Beijing Engineering Research Center of Mixed Reality and Advanced Display, Beijing Institute of Technology, Beijing, China)
,
Yan Wei
(School of Optics and Photonics, Beijing Engineering Research Center of Mixed Reality and Advanced Display, Beijing Institute of Technology, Beijing, China)
,
Shi Dawei
(Beijing BOE Optoelectronics Technology Co., Ltd, Beijing, China)
,
Xue Jianshe
(Beijing BOE Optoelectronics Technology Co., Ltd, Beijing, China)
,
Xue Wei
(School of Optics and Photonics, Beijing Engineering Research Center of Mixed Reality and Advanced Display, Beijing Institute of Technology, Beijing, China)
資料名:
Journal of the Society for Information Display
(Journal of the Society for Information Display)
巻:
28
号:
9
ページ:
767-773
発行年:
2020年
JST資料番号:
B0996B
ISSN:
1071-0922
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)