文献
J-GLOBAL ID:202002211291194643
整理番号:20A0503873
走査型ヘリウム顕微鏡における多重散乱【JST・京大機械翻訳】
Multiple scattering in scanning helium microscopy
著者 (9件):
Lambrick S. M.
(Department of Physics, Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom)
,
Vozdecky L.
(Department of Physics, Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom)
,
Bergin M.
(Department of Physics, Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom)
,
Halpin J. E.
(SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, United Kingdom)
,
MacLaren D. A.
(SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, United Kingdom)
,
Dastoor P. C.
(Centre for Organic Electronics, Physics Building, University of Newcastle, Callaghan NSW 2308, Australia)
,
Przyborski S. A.
(Department of Biosciences, Durham University, South Road, Durham DH1 3LE, United Kingdom)
,
Jardine A. P.
(Department of Physics, Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom)
,
Ward D. J.
(Department of Physics, Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
116
号:
6
ページ:
061601-061601-5
発行年:
2020年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)