文献
J-GLOBAL ID:202002216078783076
整理番号:20A0419651
同軸テレセントリック光路に基づく位相測定偏向測定における傾斜高さのあいまいさ問題への解【JST・京大機械翻訳】
Solution to the slope-height ambiguity problem in phase measuring deflectometry based on a co-axial telecentric optical path
著者 (4件):
Yue Hui-Min
(School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People’s Republic of China)
,
Wu Yu-Xiang
(School of Physics and Optoelectronic Engineering, Xidian University, Xi’an 710071, People’s Republic of China)
,
Song Yi-Ping
(School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People’s Republic of China)
,
Liu Yong
(School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People’s Republic of China)
資料名:
Measurement Science and Technology
(Measurement Science and Technology)
巻:
31
号:
4
ページ:
045007 (8pp)
発行年:
2020年
JST資料番号:
C0354C
ISSN:
0957-0233
CODEN:
MSTCEP
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)