文献
J-GLOBAL ID:202002216841099049
整理番号:20A0332657
ソフトウェア故障予測のためのvaeとGaNの比較研究【JST・京大機械翻訳】
A Comparison Study of VAE and GAN for Software Fault Prediction
著者 (7件):
Sun Yuanyuan
(School of Cyber Security, University of Chinese Academy of Sciences, Beijing, China)
,
Sun Yuanyuan
(Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China)
,
Sun Yuanyuan
(Key Laboratory of Space Utilization, Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing, China)
,
Xu Lele
(Key Laboratory of Space Utilization, Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing, China)
,
Guo Lili
(Key Laboratory of Space Utilization, Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing, China)
,
Li Ye
(Key Laboratory of Space Utilization, Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing, China)
,
Wang Yongming
(Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China)
資料名:
Lecture Notes in Computer Science
(Lecture Notes in Computer Science)
巻:
11945
ページ:
82-96
発行年:
2020年
JST資料番号:
H0078D
ISSN:
0302-9743
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)