文献
J-GLOBAL ID:202002217920303194
整理番号:20A0486910
多重Bragg高速走査ナノX線回折による完全変形テンソルの決定【JST・京大機械翻訳】
Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction
著者 (9件):
Johannes Andreas
(European Synchrotron Radiation Facility, 71 avenue des Martyrs, Grenoble, 38043, France)
,
Rensberg Jura
(Institut fuer Festkorperphysik, Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, Jena, 07743, Germany)
,
Gruenewald Tilman A.
(European Synchrotron Radiation Facility, 71 avenue des Martyrs, Grenoble, 38043, France)
,
Gruenewald Tilman A.
(Institut Fresnel, Avenue Escadrille Normandie Niemen, Marseille, 13013, France)
,
Schoppe Philipp
(Institut fuer Festkorperphysik, Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, Jena, 07743, Germany)
,
Ritzer Maurizio
(Institut fuer Festkorperphysik, Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, Jena, 07743, Germany)
,
Rosenthal Martin
(European Synchrotron Radiation Facility, 71 avenue des Martyrs, Grenoble, 38043, France)
,
Ronning Carsten
(Institut fuer Festkorperphysik, Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, Jena, 07743, Germany)
,
Burghammer Manfred
(European Synchrotron Radiation Facility, 71 avenue des Martyrs, Grenoble, 38043, France)
資料名:
Journal of Applied Crystallography
(Journal of Applied Crystallography)
巻:
53
号:
1
ページ:
99-106
発行年:
2020年
JST資料番号:
D0631A
ISSN:
0021-8898
CODEN:
JACGAR
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)