文献
J-GLOBAL ID:202002218238115885
整理番号:20A2561144
界面剥離の影響を考慮した薄い硬質膜の亀裂の解析【JST・京大機械翻訳】
Analysis on the cracking of thin hard films considering the effects of interfacial delamination
著者 (6件):
Shu Kun
(MIIT Key Laboratory of Aerospace Bearing Technology and Equipment, Harbin Institute of Technology, Harbin 150001, China)
,
Zhang Chuanwei
(MIIT Key Laboratory of Aerospace Bearing Technology and Equipment, Harbin Institute of Technology, Harbin 150001, China)
,
Zheng Dezhi
(MIIT Key Laboratory of Aerospace Bearing Technology and Equipment, Harbin Institute of Technology, Harbin 150001, China)
,
Cui Shuhui
(MIIT Key Laboratory of Aerospace Bearing Technology and Equipment, Harbin Institute of Technology, Harbin 150001, China)
,
Hou Pingping
(MIIT Key Laboratory of Aerospace Bearing Technology and Equipment, Harbin Institute of Technology, Harbin 150001, China)
,
Gu Le
(MIIT Key Laboratory of Aerospace Bearing Technology and Equipment, Harbin Institute of Technology, Harbin 150001, China)
資料名:
Surface & Coatings Technology
(Surface & Coatings Technology)
巻:
402
ページ:
Null
発行年:
2020年
JST資料番号:
D0205C
ISSN:
0257-8972
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)