文献
J-GLOBAL ID:202002218953034930
整理番号:20A2795752
制御環境における偏光スペクトル放射率測定のための新しい実験装置【JST・京大機械翻訳】
A new experimental apparatus for polarized spectral emissivity measurement in a controlled environment
著者 (5件):
Yu Kun
(Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang, Henan 453007, PR China)
,
Wang Gangquan
(Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang, Henan 453007, PR China)
,
Li Longfei
(Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang, Henan 453007, PR China)
,
Zhang Kaihua
(Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang, Henan 453007, PR China)
,
Liu Yufang
(Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang, Henan 453007, PR China)
資料名:
Infrared Physics & Technology
(Infrared Physics & Technology)
巻:
111
ページ:
Null
発行年:
2020年
JST資料番号:
H0184A
ISSN:
1350-4495
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)