文献
J-GLOBAL ID:202002223756827343
整理番号:20A1341531
ZnO/Siヘテロ接合評価のためのOhmおよびSchottky特性の両方に適用可能な同軸円形試験構造【JST・京大機械翻訳】
Coaxial Circular Test Structure Applicable to both Ohmic and Schottky Characteristics for ZnO/Si Heterojunctions Assessment
著者 (7件):
Miyazawa Norihiro
(The University of Tokyo,Department of Electrical Engineering and Information Systems)
,
Usami Naoto
(The University of Tokyo,Department of Electrical Engineering and Information Systems)
,
Wang Haibin
(The University of Tokyo,Research Center for Advanced Science and Technology)
,
Kubo Takaya
(The University of Tokyo,Research Center for Advanced Science and Technology)
,
Segawa Hiroshi
(The University of Tokyo,Research Center for Advanced Science and Technology)
,
Mita Yoshio
(The University of Tokyo,Department of Electrical Engineering and Information Systems)
,
Higo Akio
(The University of Tokyo,Systems Design Lab, School of Engineering)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
ICMTS
ページ:
1-4
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)