文献
J-GLOBAL ID:202002226303779035
整理番号:20A2556278
機械学習と説明可能なAIに基づく論理デバイス性能の自動モデリング【JST・京大機械翻訳】
Automatic Modeling of Logic Device Performance Based on Machine Learning and Explainable AI
著者 (11件):
Kim Seungju
(Data & Information Technology Center)
,
Lee Kwangseok
(Data & Information Technology Center)
,
Noh Hyeon-Kyun
(Data & Information Technology Center)
,
Shin Youngkyu
(Data & Information Technology Center)
,
Chang Kyu-Baik
(Data & Information Technology Center)
,
Jeong Jaehoon
(Data & Information Technology Center)
,
Baek Sangwon
(R & D Center / Device Solution Business Samsung Electronics Co., Ltd.,Gyeonggi-do,Republic of Korea,18448)
,
Kang Myunggil
(R & D Center / Device Solution Business Samsung Electronics Co., Ltd.,Gyeonggi-do,Republic of Korea,18448)
,
Cho Keunhwi
(R & D Center / Device Solution Business Samsung Electronics Co., Ltd.,Gyeonggi-do,Republic of Korea,18448)
,
Kim Dong-Won
(R & D Center / Device Solution Business Samsung Electronics Co., Ltd.,Gyeonggi-do,Republic of Korea,18448)
,
Kim Daesin
(Data & Information Technology Center)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
SISPAD
ページ:
47-50
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)