文献
J-GLOBAL ID:202002227574256088
整理番号:20A1935558
非線形Wienerプロセスに基づく電気コネクタ接触ペアの加速劣化試験計画の最適化【JST・京大機械翻訳】
Optimization of the Accelerated Degradation Test Plan for Electrical Connector Contact Pairs Based on a Nonlinear Wiener Process
著者 (6件):
Qian Ping
(National and Local Joint Engineering Research Center of Reliability Analysis and Testing for Mechanical and Electrical Products, Zhejiang Sci-Tech University, Hangzhou 310018, China)
,
Hong Lei
(National and Local Joint Engineering Research Center of Reliability Analysis and Testing for Mechanical and Electrical Products, Zhejiang Sci-Tech University, Hangzhou 310018, China)
,
Chen Wenhua
(National and Local Joint Engineering Research Center of Reliability Analysis and Testing for Mechanical and Electrical Products, Zhejiang Sci-Tech University, Hangzhou 310018, China)
,
Qian Yongwang
(National and Local Joint Engineering Research Center of Reliability Analysis and Testing for Mechanical and Electrical Products, Zhejiang Sci-Tech University, Hangzhou 310018, China)
,
Wang Zhe
(Beijing Institute of Control and Electronic Technology, Beijing 100038, China)
,
Yao Huajun
(Hangzhou Aerospace Electronic Technology Co., Ltd., Hangzhou 310018, China)
資料名:
Mathematical Problems in Engineering (Web)
(Mathematical Problems in Engineering (Web))
巻:
2020
ページ:
Null
発行年:
2020年
JST資料番号:
U7803A
ISSN:
1024-123X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)