文献
J-GLOBAL ID:202002232449367788
整理番号:20A2260366
確率的ニューラルネットワークに基づく電子生産システムの故障診断【JST・京大機械翻訳】
Fault diagnosis of electronic manufacturing system based on probabilistic neural network
著者 (5件):
Wei Wei
(Guilin University of Electronic Technology,College of Mechanical and Electrical Engineering,Guilin,541004)
,
Huang Chunyue
(Guilin University of Electronic Technology,College of Mechanical and Electrical Engineering,Guilin,541004)
,
Liang Ying
(Chengdu Aeronautic Vocational and Technical College,College of Electronical and Information Engineering,Chengdu,610021)
,
Xie Jun
(Guilin University of Electronic Technology,College of Mechanical and Electrical Engineering,Guilin,541004)
,
Liu Shoufu
(Guilin University of Electronic Technology,College of Mechanical and Electrical Engineering,Guilin,541004)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
ICEPT
ページ:
1-4
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)