文献
J-GLOBAL ID:202002233768006438
整理番号:20A1662381
安定で効率的なペロブスカイト太陽電池のためのI/P界面改質【JST・京大機械翻訳】
I/P interface modification for stable and efficient perovskite solar cells
著者 (12件):
Jie Zhang
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Shixin Hou
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Renjie Li
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Bingbing Chen
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Fuhua Hou
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Xinghua Cui
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Jingjing Liu
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Qi Wang
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Pengyang Wang
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Dekun Zhang
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Ying Zhao
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
,
Xiaodan Zhang
(INSTITUTE OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF NANKAI UNIVERSITY, TIANJIN 300350, CHINA;KEY LABORATORY OF PHOTOELECTRONIC THIN FILM DEVICES AND TECHNOLOGY OF TIANJIN, TIANJIN 300350,)
資料名:
Journal of Semiconductors
(Journal of Semiconductors)
巻:
41
号:
5
ページ:
75-81
発行年:
2020年
JST資料番号:
C2377A
ISSN:
1674-4926
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
中国 (CHN)
言語:
英語 (EN)