文献
J-GLOBAL ID:202002234519984253
整理番号:20A0377987
RHEEDの散漫散乱を用いたプラズマ支援分子ビームエピタクシーによるIII-窒化物材料の成長のモニタリング【JST・京大機械翻訳】
Monitoring the growth of III-nitride materials by plasma assisted molecular beam epitaxy employing diffuse scattering of RHEED
著者 (8件):
Sen Sayantani
(Centre for Research in Nanoscience and Nanotechnology, University of Calcutta, Kolkata 700106, India)
,
Paul Suchismita
(Centre for Research in Nanoscience and Nanotechnology, University of Calcutta, Kolkata 700106, India)
,
Singha Chirantan
(Centre for Research in Nanoscience and Nanotechnology, University of Calcutta, Kolkata 700106, India)
,
Saha Anirban
(Institute of Radio Physics and Electronics, University of Calcutta, Kolkata 700009, India)
,
Das Alakananda
(Institute of Radio Physics and Electronics, University of Calcutta, Kolkata 700009, India)
,
Guha Roy Pushan
(Institute of Radio Physics and Electronics, University of Calcutta, Kolkata 700009, India)
,
Pramanik Pallabi
(Department of Electronics and Telecommunication Engineering, Indian Institute of Engineering Science and Technology, Shibpur, Howrah 711103, India)
,
Bhattacharyya Anirban
(Institute of Radio Physics and Electronics, University of Calcutta, Kolkata 700009, India)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
38
号:
1
ページ:
014007-014007-7
発行年:
2020年
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)