文献
J-GLOBAL ID:202002235825908200
整理番号:20A1716252
軟X線自由電子レーザと楕円鏡を用いた元素選択性による走査型磁気光学Kerr効果(MOKE)測定【JST・京大機械翻訳】
Scanning magneto-optical Kerr effect (MOKE) measurement with element-selectivity by using a soft x-ray free-electron laser and an ellipsoidal mirror
著者 (12件):
Kubota Yuya
(RIKEN SPring-8 Center, Sayo 679-5148, Japan)
,
Motoyama Hiroto
(Department of Chemistry, School of Science, The University of Tokyo, Bunkyo 113-0033, Japan)
,
Yamaguchi Gota
(Department of Precision Engineering, School of Engineering, The University of Tokyo, Bunkyo 113-0033, Japan)
,
Egawa Satoru
(Department of Precision Engineering, School of Engineering, The University of Tokyo, Bunkyo 113-0033, Japan)
,
Takeo Yoko
(Department of Precision Engineering, School of Engineering, The University of Tokyo, Bunkyo 113-0033, Japan)
,
Mizuguchi Masaki
(Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan)
,
Sharma Himanshu
(Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan)
,
Owada Shigeki
(RIKEN SPring-8 Center, Sayo 679-5148, Japan)
,
Tono Kensuke
(RIKEN SPring-8 Center, Sayo 679-5148, Japan)
,
Mimura Hidekazu
(Department of Precision Engineering, School of Engineering, The University of Tokyo, Bunkyo 113-0033, Japan)
,
Matsuda Iwao
(Institute for Solid State Physics, The University of Tokyo, Kashiwa 277-8581, Japan)
,
Yabashi Makina
(RIKEN SPring-8 Center, Sayo 679-5148, Japan)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
117
号:
4
ページ:
042405-042405-5
発行年:
2020年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)