文献
J-GLOBAL ID:202002241132300447
整理番号:20A0826824
垂直チャネル3D NANDにおけるチャネルテーパの影響緩和【JST・京大機械翻訳】
Mitigating the Impact of Channel Tapering in Vertical Channel 3-D NAND
著者 (5件):
Bhatt Upendra Mohan
(Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, India)
,
Manhas Sanjeev Kumar
(Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, India)
,
Kumar Arvind
(Advanced Product and Technology Development (APTD), Applied Materials, Santa Clara, CA, USA)
,
Pakala Mahendra
(Advanced Product and Technology Development (APTD), Applied Materials, Santa Clara, CA, USA)
,
Yieh Ellie
(Advanced Product and Technology Development (APTD), Applied Materials, Santa Clara, CA, USA)
資料名:
IEEE Transactions on Electron Devices
(IEEE Transactions on Electron Devices)
巻:
67
号:
3
ページ:
929-936
発行年:
2020年
JST資料番号:
C0222A
ISSN:
0018-9383
CODEN:
IETDAI
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)