文献
J-GLOBAL ID:202002241184381852
整理番号:20A0866798
Ge量子ドット光ルミネセンス波長と励起子寿命における窒化物-ストレスまたは量子サイズ工学【JST・京大機械翻訳】
Nitride-stressor and quantum-size engineering in Ge quantum-dot photoluminescence wavelength and exciton lifetime
著者 (8件):
Kuo Yu-Hong
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
,
Chiu Shih-Hsuan
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
,
Tien Che-Wei
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
,
Lin Sheng-Di
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
,
Chang Wen-Hao
(Department of Electrophysics, National Chiao Tung University, Hsinchu 300, Taiwan, People’s Republic of China)
,
George Thomas
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
,
Lin Horng-Chih
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
,
Li Pei-Wen
(Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan,People’s Republic of China)
資料名:
Nano Futures
(Nano Futures)
巻:
4
号:
1
ページ:
015001 (9pp)
発行年:
2020年
JST資料番号:
W5572A
ISSN:
2399-1984
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)