文献
J-GLOBAL ID:202002241398201730
整理番号:20A1425582
蛍石構造に基づく強誘電体HfO_2メモリFeFETの温度依存性動作に関する研究:焦電性と信頼性【JST・京大機械翻訳】
A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability
著者 (18件):
Ali T.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Kuhnel K.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Czernohorsky M.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Mart C.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Rudolph M.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Patzold B.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Lehninger D.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Olivo R.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Lederer M.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Muller F.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Hoffmann R.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Metzger J.
(GLOBALFOUNDRIES Fab1 LLC & Company KG, Dresden, Germany)
,
Binder R.
(GLOBALFOUNDRIES Fab1 LLC & Company KG, Dresden, Germany)
,
Steinke P.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Kampfe T.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Muller J.
(GLOBALFOUNDRIES Fab1 LLC & Company KG, Dresden, Germany)
,
Seidel K.
(Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany)
,
Eng L. M.
(Institut fuer Angewandte Physik, Technische Universitaet Dresden, Dresden, Germany)
資料名:
IEEE Transactions on Electron Devices
(IEEE Transactions on Electron Devices)
巻:
67
号:
7
ページ:
2981-2987
発行年:
2020年
JST資料番号:
C0222A
ISSN:
0018-9383
CODEN:
IETDAI
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)