文献
J-GLOBAL ID:202002249755318403
整理番号:20A0765974
アルゴンガスクラスタイオンビームを用いたOLED材料のTOF-SIMS OLED検査への有望なアプローチ【JST・京大機械翻訳】
ToF-SIMS of OLED materials using argon gas cluster ion Beam: A promising approach for OLED inspection
著者 (9件):
Baek Ji Young
(Center for Scientific Instrumentation, Korea Basic Science Institute, Cheongju, Republic of Korea)
,
Choi Chang Min
(Center for Scientific Instrumentation, Korea Basic Science Institute, Cheongju, Republic of Korea)
,
Lee Sang Ju
(Center for Scientific Instrumentation, Korea Basic Science Institute, Cheongju, Republic of Korea)
,
Min Boo Ki
(Center for Scientific Instrumentation, Korea Basic Science Institute, Cheongju, Republic of Korea)
,
Kang Hwa Seung
(Department of Information Display Engineering, Hanyang University, Seoul, Republic of Korea)
,
Choo Dong Chul
(Department of Electronics and Computer Engineering, Hanyang University, Seoul, Republic of Korea)
,
Sung Ji Yeong
(Busan Center, Korea Basic Science Institute, Busan, Republic of Korea)
,
Jin Jong Sung
(Busan Center, Korea Basic Science Institute, Busan, Republic of Korea)
,
Choi Myoung Choul
(Center for Scientific Instrumentation, Korea Basic Science Institute, Cheongju, Republic of Korea)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
507
ページ:
Null
発行年:
2020年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)