文献
J-GLOBAL ID:202002249806627900
整理番号:20A1568891
薄膜強誘電体のBarkhausen雑音解析【JST・京大機械翻訳】
Barkhausen noise analysis of thin film ferroelectrics
著者 (5件):
Yazawa Keisuke
(School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907, USA)
,
Ducharne Benjamin
(Institut National des Sciences Appliquees de Lyon, Laboratoire Genie Electrique et Ferroelectricite LGEF, 8 rue de la Physique, 69621 Villeurbanne Cedex, France)
,
Uchida Hiroshi
(Department of Materials and Life Sciences, Sophia University, Tokyo 102-8554, Japan)
,
Funakubo Hiroshi
(Department of Materials Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, Tokyo 152-8550, Japan)
,
Blendell John E.
(School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907, USA)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
117
号:
1
ページ:
012902-012902-4
発行年:
2020年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)