文献
J-GLOBAL ID:202002250314953638
整理番号:20A1555169
エポキシ複合材料の短時間絶縁破壊と長時間電気的エージングに及ぼす無機充填剤の影響【JST・京大機械翻訳】
Effects of inorganic fillers on withstanding short-time breakdown and long-time electrical aging of epoxy composites
著者 (4件):
Li Zhe
(Department of Electrical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Minhang, Shanghai, 200240, China)
,
Sheng Gehao
(Department of Electrical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Minhang, Shanghai, 200240, China)
,
Jiang Xiuchen
(Department of Electrical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Minhang, Shanghai, 200240, China)
,
Tanaka Toshikatsu
(IPS Research Center, Waseda University, 2-7 Hibikino, Wakamatsu-ku, Kitakyushu-shi, 808-0135, Japan)
資料名:
IEEJ Transactions on Electrical and Electronic Engineering
(IEEJ Transactions on Electrical and Electronic Engineering)
巻:
12 Suppl S2
ページ:
S10-S15
発行年:
2017年
JST資料番号:
W1854A
ISSN:
1931-4973
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)