文献
J-GLOBAL ID:202002251471811556
整理番号:20A0763532
Al_0.62Sc_0.38N薄膜における異常配向粒の入射による圧電特性に及ぼす負バイアスの影響【JST・京大機械翻訳】
Impact of negative bias on the piezoelectric properties through the incidence of abnormal oriented grains in Al0.62Sc0.38N thin films
著者 (9件):
Sandu C.S.
(Electroceramic Thin Films Group, Ecole Polytechnique Federale de Lausanne EPFL, Lausanne CH-1015, Switzerland)
,
Sandu C.S.
(Department of Physics, University of Craiova, Craiova 200585, Romania)
,
Sandu C.S.
(Interdisciplinary Centre for Electron Microscopy (CIME), Ecole Polytechnique Federale de Lausanne (EPFL), Lausanne CH-1015, Switzerland)
,
Parsapour F.
(Electroceramic Thin Films Group, Ecole Polytechnique Federale de Lausanne EPFL, Lausanne CH-1015, Switzerland)
,
Xiao D.
(Electroceramic Thin Films Group, Ecole Polytechnique Federale de Lausanne EPFL, Lausanne CH-1015, Switzerland)
,
Nigon R.
(Electroceramic Thin Films Group, Ecole Polytechnique Federale de Lausanne EPFL, Lausanne CH-1015, Switzerland)
,
Riemer L.M.
(Group of ferroelectrics and functional oxides, Ecole Polytechnique Federale de Lausanne EPFL, Lausanne CH-1015, Switzerland)
,
LaGrange T.
(Interdisciplinary Centre for Electron Microscopy (CIME), Ecole Polytechnique Federale de Lausanne (EPFL), Lausanne CH-1015, Switzerland)
,
Muralt P.
(Electroceramic Thin Films Group, Ecole Polytechnique Federale de Lausanne EPFL, Lausanne CH-1015, Switzerland)
資料名:
Thin Solid Films
(Thin Solid Films)
巻:
697
ページ:
Null
発行年:
2020年
JST資料番号:
B0899A
ISSN:
0040-6090
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)