文献
J-GLOBAL ID:202002254947295514
整理番号:20A2614919
真空蒸着安定化a-Se光伝導膜の正孔寿命に及ぼす高線量X線照射の影響:X線検出器に用いられるa-Seの品質管理への含意【JST・京大機械翻訳】
Effects of High-Dose X-Ray Irradiation on the Hole Lifetime in Vacuum-Deposited Stabilized a-Se Photoconductive Films: Implications to the Quality Control of a-Se Used in X-Ray Detectors
著者 (3件):
Simonson B.
(Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
,
Johanson R. E.
(Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
,
Kasap S. O.
(Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
資料名:
IEEE Transactions on Nuclear Science
(IEEE Transactions on Nuclear Science)
巻:
67
号:
11
ページ:
2445-2453
発行年:
2020年
JST資料番号:
C0235A
ISSN:
0018-9499
CODEN:
IETNAE
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)