文献
J-GLOBAL ID:202002256334306900
整理番号:20A2473020
画像処理を用いた内部トンネル表面の亀裂検出【JST・京大機械翻訳】
Crack Detection on Inner Tunnel Surface Using Image Processing
著者 (6件):
Biswas Debanshu
(School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, India)
,
Nayak Ipsit
(School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, India)
,
Choudhury Shaibal
(School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, India)
,
Acharjee Trishaani
(School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, India)
,
Sidhant
(School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, India)
,
Mishra Mayank
(School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, India)
資料名:
Advances in Intelligent Systems and Computing
(Advances in Intelligent Systems and Computing)
巻:
1198
ページ:
3-12
発行年:
2020年
JST資料番号:
W5075A
ISSN:
2194-5357
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)