文献
J-GLOBAL ID:202002257542339623
整理番号:20A0953723
X線CCD応用のためのXCR4C ASICのSEL指向RADハード戦略と特性評価【JST・京大機械翻訳】
SEL-Oriented Rad-Hard Strategy and Characterization of the XCR4C ASIC for X-ray CCD Applications
著者 (9件):
Lu Bo
(Chinese Academy of Sciences,Key Laboratory of Particle Astrophysics, Institute of High Energy Physics,Beijing,China,100049)
,
Huo Jia
(Chinese Academy of Sciences,Key Laboratory of Particle Astrophysics, Institute of High Energy Physics,Beijing,China,100049)
,
Chen Yong
(Chinese Academy of Sciences,Key Laboratory of Particle Astrophysics, Institute of High Energy Physics,Beijing,China,100049)
,
Wei Wei
(State Key Laboratory of Particle Detection and Electronics,Beijing,China,100049)
,
Li Bo
(Chinese Academy of Sciences,Institute of Microelectronics)
,
Gao Jiantou
(Chinese Academy of Sciences,Institute of Microelectronics)
,
Wang Chunlin
(Chinese Academy of Sciences,Institute of Microelectronics)
,
Liu Hainan
(Chinese Academy of Sciences,Institute of Microelectronics)
,
Zhou Yumei
(Chinese Academy of Sciences,Institute of Microelectronics)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2019
号:
NSS/MIC
ページ:
1-4
発行年:
2019年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)