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J-GLOBAL ID:202002263609040490   整理番号:20A2567759

優れた感度とサブパート当たり検出限界を持つテルレンナノフレークベースのNO_2センサ【JST・京大機械翻訳】

Tellurene Nanoflake-Based NO2 Sensors with Superior Sensitivity and a Sub-Parts-per-Billion Detection Limit
著者 (12件):
Cui Heping
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Zheng Kai
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Xie Zhongjian
(Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics, SZU-NUS Collaborative Innovation Center for Optoelectronic Science & Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Physi...)
Yu Jiabing
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Zhu Xiangyi
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Ren Hao
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Wang Zeping
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Zhang Feng
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Li Xiandong
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Tao Lu-Qi
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)
Zhang Han
(Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics, SZU-NUS Collaborative Innovation Center for Optoelectronic Science & Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Physi...)
Chen Xianping
(Key Laboratory of Optoelectronic Technology & Systems, Education Ministry of China, and College of Optoelectronic Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, China)

資料名:
ACS Applied Materials & Interfaces  (ACS Applied Materials & Interfaces)

巻: 12  号: 42  ページ: 47704-47713  発行年: 2020年 
JST資料番号: W2329A  ISSN: 1944-8244  CODEN: AAMICK  資料種別: 逐次刊行物 (A)
記事区分: 原著論文  発行国: アメリカ合衆国 (USA)  言語: 英語 (EN)
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