文献
J-GLOBAL ID:202002264986222786
整理番号:20A2039146
Si-SiO_2界面における応力の理解と制御【JST・京大機械翻訳】
Understanding and Control of Stress at Si-SiO2 Interface
著者 (6件):
Kropman Daniel
(University of Tartu, Tartu Estonia W. Ostwaldi tn 1)
,
Seeman Viktor
(University of Tartu, Tartu Estonia W. Ostwaldi tn 1)
,
Medvids Arturs
(Riga Technical University, Institute of Technical Physics Faculty of Materials Science and Applied Chemistry Riga Latvia P. Valdena 3/7)
,
Onufrijevs Pavels
(Riga Technical University, Institute of Technical Physics Faculty of Materials Science and Applied Chemistry Riga Latvia P. Valdena 3/7)
,
Vitusevich Svetlana
(Bioelectronics (ICS-8), Forschungszentrum Juelich, Juelich Germany)
,
Mikli Valdek
(Tallinn University of Technology, Department of Materials and Environmental Technology Tallinn Estonia)
資料名:
Key Engineering Materials
(Key Engineering Materials)
巻:
850
ページ:
291-296
発行年:
2020年
JST資料番号:
D0744C
ISSN:
1013-9826
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
スイス (CHE)
言語:
英語 (EN)