文献
J-GLOBAL ID:202002267289199003
整理番号:20A0394905
歪エンジニアリング下の単分子層α-In_2Se_3における強誘電性とトポロジカル相転移の共存【JST・京大機械翻訳】
The coexistence of ferroelectricity and topological phase transition in monolayer α-In2Se3 under strain engineering
著者 (4件):
Jiang Xingxing
(Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, People’s Republic of China)
,
Feng Yexin
(Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, People’s Republic of China)
,
Chen Ke-Qiu
(Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, People’s Republic of China)
,
Tang Li-Ming
(Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, People’s Republic of China)
資料名:
Journal of Physics. Condensed Matter
(Journal of Physics. Condensed Matter)
巻:
32
号:
10
ページ:
105501 (8pp)
発行年:
2020年
JST資料番号:
B0914B
ISSN:
0953-8984
CODEN:
JCOMEL
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)