文献
J-GLOBAL ID:202002268564387420
整理番号:20A2500817
ルーチン試験間隔を持つセキュリティおよび安定性制御システムに対するリスク最適化および感度解析【JST・京大機械翻訳】
Risk Optimization and Sensitivity Analysis to Security and Stability Control System with Routine Test Interval
著者 (6件):
Yan Yunsong
(NARI Group Corporation (State Grid Electric Power Research Institute),Power Grid Security and Stability Control Technology Branch,Nanjing,China)
,
Sun Ning
(NARI Group Corporation (State Grid Electric Power Research Institute),Power Grid Security and Stability Control Technology Branch,Nanjing,China)
,
Zhang Nan
(Hefei University of Technology,School of Electrical Engineering and Automation,Hefei,China)
,
Li Shenghu
(Hefei University of Technology,School of Electrical Engineering and Automation,Hefei,China)
,
Li Mingying
(NARI Group Corporation (State Grid Electric Power Research Institute),Power Grid Security and Stability Control Technology Branch,Nanjing,China)
,
Wang Dayang
(State Grid Jiangsu Electric Power Co. Ltd.,Information & Communication Branch,Nanjing,China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
ICPRE
ページ:
66-71
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)