文献
J-GLOBAL ID:202002274505005034
整理番号:20A2767696
アナログRRAMデバイスにおける保持故障挙動の研究【JST・京大機械翻訳】
Investigation of Retention Failure Behavior in Analog RRAM Devices
著者 (9件):
Song Wendong
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Lee Hock Koon
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Wang Weijie
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Li Minghua
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Chen Zhixian
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Liu Jen-Chieh
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Wang I-Ting
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Zhuo Victor Yi-Qian
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
,
Zhu Yao
(Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR),Singapore,138634)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
IPFA
ページ:
1-4
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)