文献
J-GLOBAL ID:202002282927240982
整理番号:20A1058180
非同一相関成分に基づく故障タイプの一般電子システムの信頼性モデルと感度解析【JST・京大機械翻訳】
Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components
著者 (4件):
Banitaba Seyed Mostafa
(Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran)
,
Ahari Roya M.
(Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran)
,
Karbasian Mahdi
(Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran)
,
Karbasian Mahdi
(Department of Industrial Engineering, Maleke Ashtar University of Technology, Shahinshahr, Iran)
資料名:
Journal of Electronic Testing. Theory and Applications
(Journal of Electronic Testing. Theory and Applications)
巻:
36
号:
1
ページ:
9-21
発行年:
2020年
JST資料番号:
W2084A
ISSN:
0923-8174
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)