文献
J-GLOBAL ID:202002283217688646
整理番号:20A1236163
その場二次元X線回折測定により決定した非晶質から多結晶SnドープIn2O3膜への内在秩序の進展
Evolution of implicate order from amorphous to polycrystalline Sn-doped In2O3 films determined by in situ two-dimensional X-ray diffraction measurements
著者 (9件):
Furubayashi Yutaka
(Materials Design Center, Research Institute, Kochi University of Technology, Tosayamadacho-Miyanokuchi 185, Kami 782-8502, Japan)
,
Kobayashi Shintaro
(Rigaku Cooperation, Matsubaracho 3-9-12, Akishima 196-8666, Japan)
,
Maehara Makoto
(Industrial Equipment Division, Sumitomo Heavy Industries, Ltd., Soubiraki-cho 5-2, Niihama 792-8588, Japan)
,
Ishikawa Kazuhiko
(Rigaku Cooperation, Matsubaracho 3-9-12, Akishima 196-8666, Japan)
,
Inaba Katsuhiko
(Rigaku Cooperation, Matsubaracho 3-9-12, Akishima 196-8666, Japan)
,
Sakemi Toshiyuki
(Technology Research Center, Sumitomo Heavy Industries, Ltd., Natsushimacho 19, Yokosuka 237-8555, Japan)
,
Kitami Hisashi
(Materials Design Center, Research Institute, Kochi University of Technology, Tosayamadacho-Miyanokuchi 185, Kami 782-8502, Japan)
,
Kitami Hisashi
(Technology Research Center, Sumitomo Heavy Industries, Ltd., Natsushimacho 19, Yokosuka 237-8555, Japan)
,
Yamamoto Tetsuya
(Materials Design Center, Research Institute, Kochi University of Technology, Tosayamadacho-Miyanokuchi 185, Kami 782-8502, Japan)
資料名:
Applied Physics Express
(Applied Physics Express)
巻:
13
号:
6
ページ:
065502 (5pp)
発行年:
2020年06月
JST資料番号:
F0599C
ISSN:
1882-0778
CODEN:
APEPC4
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
イギリス (GBR)
言語:
英語 (EN)