文献
J-GLOBAL ID:202002283780916299
整理番号:20A2648300
スケーリングダウン技術とスキームによる電流基準回路の電磁感受率に関する比較研究【JST・京大機械翻訳】
A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes
著者 (13件):
Wang Zhian
(School of Microelectronics, University of Chinese Academy of Sciences, Beijing, China)
,
Wang Zhian
(Key Laboratory of Silicon Devices and Technology, Chinese Academy of Sciences, Beijing, China)
,
Li Binhong
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
,
Li Binhong
(Guangdong Greater Bay Area Institute of Integrated Circuit and System, Guangdong, China)
,
Wu Jianfei
(National University of Defense Technology, Changsha, China)
,
Zhao Wenxin
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
,
Li Bo
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
,
Li Bo
(Key Laboratory of Silicon Devices and Technology, Chinese Academy of Sciences, Beijing, China)
,
Liu Hainan
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
,
Guan Chongjie
(School of Microelectronics, Beijing University of Technology, Beijing, China)
,
Feng Shiwei
(School of Microelectronics, Beijing University of Technology, Beijing, China)
,
Luo Jiajun
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
,
Ye Tianchun
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
114
ページ:
Null
発行年:
2020年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)