文献
J-GLOBAL ID:202002284308339368
整理番号:20A0953733
位置有感MCP遅延線検出器のための高分解能エレクトロニクス【JST・京大機械翻訳】
High Resolution Electronics for a Position Sensitive MCP Delay-line Detector
著者 (5件):
Dong Wenhao
(University of Science and Technology of China,State Key Laboratory of Particle Detection and Electronics,Hefei,China,230026)
,
Feng Changqing
(University of Science and Technology of China,State Key Laboratory of Particle Detection and Electronics,Hefei,China,230026)
,
Shi Yufeng
(Shandong Aerospace Electro-technology Institute (SAEI) in China)
,
Song Xiaolin
(Shandong Aerospace Electro-technology Institute (SAEI) in China)
,
Liu Shubin
(University of Science and Technology of China,State Key Laboratory of Particle Detection and Electronics,Hefei,China,230026)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2019
号:
NSS/MIC
ページ:
1-4
発行年:
2019年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)