文献
J-GLOBAL ID:202002284846749264
整理番号:20A0904630
暗号鍵の極低ビット誤り率のためのインタリーブセルミラーリングと自己適応分割を用いた28nm512kb隣接2T2R RRAM PUF【JST・京大機械翻訳】
A 28nm 512Kb adjacent 2T2R RRAM PUF with interleaved cell mirroring and self-adaptive splitting for extremely low bit error rate of cryptographic key
著者 (7件):
Xue Xiaoyong
(ASIC and System State Key Laboratory, School of Microelectronics, Fudan University,China)
,
Yang Jianguo
(Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences,China)
,
Zhang Yuejun
(School of Electrical Engineering and Computer Science, Ningbo University,Ningbo,China)
,
Wang Mingyu
(ASIC and System State Key Laboratory, School of Microelectronics, Fudan University,China)
,
Lv Hangbing
(Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences,China)
,
Zeng Xiaoyang
(ASIC and System State Key Laboratory, School of Microelectronics, Fudan University,China)
,
Liu Ming
(Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences,China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2019
号:
A-SSCC
ページ:
29-32
発行年:
2019年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)