文献
J-GLOBAL ID:202002285028485524
整理番号:20A0856314
大規模知的表面(LISS)の性能解析:漸近データレートおよびチャネル硬化効果【JST・京大機械翻訳】
Performance Analysis of Large Intelligent Surfaces (LISs): Asymptotic Data Rate and Channel Hardening Effects
著者 (5件):
Jung Minchae
(Department of Electrical and Computer Engineering, Wireless@VT, Virginia Tech, Blacksburg, VA, USA)
,
Saad Walid
(Department of Electrical and Computer Engineering, Wireless@VT, Virginia Tech, Blacksburg, VA, USA)
,
Jang Youngrok
(School of Electrical Electronic Engineering, Yonsei University, Seoul, South Korea)
,
Kong Gyuyeol
(Department of Signal Processing and Acoustics, Aalto University, Espoo, Finland)
,
Choi Sooyong
(School of Electrical Electronic Engineering, Yonsei University, Seoul, South Korea)
資料名:
IEEE Transactions on Wireless Communications
(IEEE Transactions on Wireless Communications)
巻:
19
号:
3
ページ:
2052-2065
発行年:
2020年
JST資料番号:
W1329A
ISSN:
1536-1276
CODEN:
ITWCAX
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)