文献
J-GLOBAL ID:202002287150454379
整理番号:20A1236132
バンドギャップエネルギー以上及びサブバンドギャップエネルギー励起により解析した自立n-GaN層における深い準位に関連した電荷移動過程
Charge transfer processes related to deep levels in free standing n-GaN layer analyzed by above and sub-bandgap energy excitation
著者 (5件):
Uehara Daisuke
(Graduate School of Electrical and Electronic Engineering, Chiba University, 1-33 Yayoicho, Inage-ku, Chiba, 263-8522, Japan)
,
Kikuchi Moe
(Graduate School of Electrical and Electronic Engineering, Chiba University, 1-33 Yayoicho, Inage-ku, Chiba, 263-8522, Japan)
,
Ma Bei
(Graduate School of Electrical and Electronic Engineering, Chiba University, 1-33 Yayoicho, Inage-ku, Chiba, 263-8522, Japan)
,
Miyake Hideto
(Graduate School of Regional Innovation Studies, Mie University, 1577 Kurimamachiya, Tsu, 514-8507, Japan)
,
Ishitani Yoshihiro
(Graduate School of Electrical and Electronic Engineering, Chiba University, 1-33 Yayoicho, Inage-ku, Chiba, 263-8522, Japan)
資料名:
Applied Physics Express
(Applied Physics Express)
巻:
13
号:
6
ページ:
061003 (5pp)
発行年:
2020年06月
JST資料番号:
F0599C
ISSN:
1882-0778
CODEN:
APEPC4
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
イギリス (GBR)
言語:
英語 (EN)