文献
J-GLOBAL ID:202002290673269488
整理番号:20A0284021
Si(111)基板上に成長させたMnSi薄膜の結晶学的キラリティの決定【JST・京大機械翻訳】
Determination of crystallographic chirality of MnSi thin film grown on Si (111) substrate
著者 (10件):
Morikawa Daisuke
(RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan)
,
Yamasaki Yuichi
(RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan)
,
Yamasaki Yuichi
(Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan)
,
Yamasaki Yuichi
(Research and Services Division of Materials Data and Integrated System (MaDIS), National Institute for Materials Science (NIMS), Tsukuba 305-0047, Japan)
,
Kanazawa Naoya
(Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan)
,
Yokouchi Tomoyuki
(Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan)
,
Tokura Yoshinori
(RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan)
,
Tokura Yoshinori
(Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan)
,
Arima Taka-hisa
(RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan)
,
Arima Taka-hisa
(Department of Advanced Materials Science, University of Tokyo, Kashiwa 277-8561, Japan)
資料名:
Physical Review Materials
(Physical Review Materials)
巻:
4
号:
1
ページ:
014407
発行年:
2020年
JST資料番号:
W3690A
ISSN:
2475-9953
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)