文献
J-GLOBAL ID:202002291246559089
整理番号:20A0656887
ホウ素単分子層ドーピング:ナノスケールにおける酸化物キャッピング層,分子フラグメンテーションおよびドーピング均一性の役割【JST・京大機械翻訳】
Boron Monolayer Doping: Role of Oxide Capping Layer, Molecular Fragmentation, and Doping Uniformity at the Nanoscale
著者 (7件):
Tzaguy Avra
(Institute of Chemistry and The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Edmond J. Safra Campus, Givat Ram Jerusalem, 91904, Israel)
,
Karadan Prajith
(Institute of Chemistry and The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Edmond J. Safra Campus, Givat Ram Jerusalem, 91904, Israel)
,
Killi Krushnamurty
(Institute of Chemistry and The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Edmond J. Safra Campus, Givat Ram Jerusalem, 91904, Israel)
,
Hazut Ori
(Institute of Chemistry and The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Edmond J. Safra Campus, Givat Ram Jerusalem, 91904, Israel)
,
Amit Iddo
(Department of Physical Electronics-School of Electrical Engineering, Tel Aviv University, Ramat Aviv, 69978, Israel)
,
Rosenwaks Yossi
(Department of Physical Electronics-School of Electrical Engineering, Tel Aviv University, Ramat Aviv, 69978, Israel)
,
Yerushalmi Roie
(Institute of Chemistry and The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Edmond J. Safra Campus, Givat Ram Jerusalem, 91904, Israel)
資料名:
Advanced Materials Interfaces
(Advanced Materials Interfaces)
巻:
7
号:
5
ページ:
e1902198
発行年:
2020年
JST資料番号:
W2484A
ISSN:
2196-7350
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)