文献
J-GLOBAL ID:202002297577809785
整理番号:20A2550971
1.3μm InAs量子ドットレーザダイオードの劣化:転位密度と量子ドット層の数の影響【JST・京大機械翻訳】
Degradation of 1.3 μm InAs Quantum-Dot Laser Diodes: Impact of Dislocation Density and Number of Quantum Dot Layers
著者 (10件):
Buffolo Matteo
(Department of Information Engineering, University of Padova, Padova, Italy)
,
Rovere Lorenzo
(Department of Information Engineering, University of Padova, Padova, Italy)
,
De Santi Carlo
(Department of Information Engineering, University of Padova, Padova, Italy)
,
Jung Daehwan
(University of California, Santa Barbara, CA, USA)
,
Norman Justin
(Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA)
,
Bowers John E.
(Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA)
,
Herrick Robert W.
(Intel Corporation, Santa Clara, CA, USA)
,
Meneghesso Gaudenzio
(Department of Information Engineering, University of Padova, Padova, Italy)
,
Zanoni Enrico
(Department of Information Engineering, University of Padova, Padova, Italy)
,
Meneghini Matteo
(Department of Information Engineering, University of Padova, Padova, Italy)
資料名:
IEEE Journal of Quantum Electronics
(IEEE Journal of Quantum Electronics)
巻:
57
号:
1
ページ:
ROMBUNNO.2000108.1-8
発行年:
2021年
JST資料番号:
H0432A
ISSN:
0018-9197
CODEN:
IEJQA7
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)